저항성-유도성-용량성 센서의 공진 위상 감지

• Main Authors: MARU SIDDHARTH, DAS TEJASVI, DOY ANTHONY S, YOU ZHONG, KINNEY DREW, KING ERIC J, MARIJANOVIC SRDJAN, BEARDSWORTH MATTHEW, MARCHAIS EMMANUEL, LAPOINTE LUKE
• Format: Patent
• Language: Korean
• Published: 08.12.2020
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; TARIFF METERING APPARATUS; TESTING

시스템은 저항성-유도성-용량성 센서, 구동 주파수에서 상기 저항성-유도성-용량성 센서를 구동하도록 구성된 구동기, 및 상기 저항성-유도성-용량성 센서에 통신 가능하게 결합된 측정 회로로서, 상기 저항성-유도성-용량성 센서와 관련된 위상 정보를 측정하고 상기 위상 정보에 기초하여 상기 저항성-유도성-용량성 센서에 대한 기계 부재의 변위를 결정하도록 구성되는, 상기 측정 회로를 포함하며, 여기서 상기 기계 부재의 변위는 상기 저항성-유도성-용량성 센서의 임피던스 변화를 야기한다. A system may include a resistive-inductive-capacitive sensor, a driver configured to drive the resistive-inductive-capacitive sensor at a driving frequency, and a measurement circuit communicatively coupled to the resistive-inductive-capacitive sensor and configured to measure phase information associated with the resistive-inductive-capacitive sensor and based on the phase information, determine a displacement of a mechanical member relative to the resistive-inductive-capacitive sensor, wherein the displacement of the mechanical member causes a change in an impedance of the resistive-inductive-capacitive sensor.