ZERO MASK HIGH DENSITY CAPACITOR

Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A secon...

Full description

Saved in:
Bibliographic Details
Main Authors WU CHIA TIEN, HSIEH CHENG HSIANG, CHEN CHUNG HUI, CHEN WAN TE
Format Patent
LanguageEnglish
Korean
Published 03.12.2020
Subjects
Online AccessGet full text

Cover

Loading…
Abstract Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A second resistive layer is formed on an upper portion of the dielectric layer. 추가 마스크의 사용을 제거하는 방법 및 반도체 다바이스가 본 명세서에 설명된다. 제 1 상호 접속 층이 형성된다. 제 1 상호 접속 층의 상부에 제 1 저항 층이 형성된다. 제 1 저항 층의 상부에 유전체 층이 형성된다. 유전체 층의 상부에 제 2 저항 층이 형성된다.
AbstractList Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A second resistive layer is formed on an upper portion of the dielectric layer. 추가 마스크의 사용을 제거하는 방법 및 반도체 다바이스가 본 명세서에 설명된다. 제 1 상호 접속 층이 형성된다. 제 1 상호 접속 층의 상부에 제 1 저항 층이 형성된다. 제 1 저항 층의 상부에 유전체 층이 형성된다. 유전체 층의 상부에 제 2 저항 층이 형성된다.
Author CHEN CHUNG HUI
WU CHIA TIEN
CHEN WAN TE
HSIEH CHENG HSIANG
Author_xml – fullname: WU CHIA TIEN
– fullname: HSIEH CHENG HSIANG
– fullname: CHEN CHUNG HUI
– fullname: CHEN WAN TE
BookMark eNrjYmDJy89L5WRQiHIN8lfwdQz2VvDwdPdQcHH1C_YMiVRwdgxwdPYM8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBkYGBobGpuaGlo7GxKkCAE89JF8
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate 제로 마스크 고밀도 커패시터
ExternalDocumentID KR20200135719A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20200135719A3
IEDL.DBID EVB
IngestDate Fri Nov 08 04:46:09 EST 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20200135719A3
Notes Application Number: KR20200027875
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&CC=KR&NR=20200135719A
ParticipantIDs epo_espacenet_KR20200135719A
PublicationCentury 2000
PublicationDate 20201203
PublicationDateYYYYMMDD 2020-12-03
PublicationDate_xml – month: 12
  year: 2020
  text: 20201203
  day: 03
PublicationDecade 2020
PublicationYear 2020
RelatedCompanies TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
RelatedCompanies_xml – name: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD
Score 3.2590568
Snippet Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title ZERO MASK HIGH DENSITY CAPACITOR
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&locale=&CC=KR&NR=20200135719A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTZPTja3MDDXNU9KTtMF3QSrm5SSZKALPqnE3DIl1QJ87KKvn5lHqIlXhGkEE0MObC8M-JzQcvDhiMAclQzM7yXg8roAMYjlAl5bWayflAkUyrd3C7F1UYP2jo1AW0GN1VycbF0D_F38ndWcnW29g9T8gsBywNaOqbmhpSMzAyuwIW0Oyg-uYU6gfSkFyJWKmyADWwDQvLwSIQam7HxhBk5n2N1rwgwcvtApbyATmvuKRRgUolyD_BV8HYO9FTw83T0UXFz9gj1DIhWcHQMcnT1D_INEGZTdXEOcPXSBVsXDfRbvHYTsLmMxBhZgnz9VgkEhxcjE1NQs1cg0Cdj9SjJPSkwzNU4xTgNtSzMyTE00lGSQwWeSFH5paQYuEBe8KsNYhoGlpKg0VRZYt5YkyYGDBAAsMHfH
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qFetNq-KjakDJLdgkTbc9BEk3iYlpHqRRWi-hmweIYouN-PfdXVLtqbdlB2Yf8O3s7M43A3CXoSxDgy6SEMlKiVWClUhOuhLPVIKGeTHgaRf9oO88956m2rQBH2suDM8T-sOTI1JEZRTvFT-vl_-PWCaPrVzdkzfatXiwE90Ua-9YYVRQVTRHuhWFZohFjHUvFoOYy-htR0Py0NiBXXrJRgwP1suI8VKWm0bFPoS9iOr7rI6g8b5oQwuva6-1Yd-vv7xps0bf6hiEVysOBd-YeILjPjqCaQUTN5kJ2IgM7CZhfAK3tpVgR6JDpX8rS714c17qKTSpz1-cgZArPU3rF4pGqPtFEJmXmpqrJaOlKXIxl8-hs03TxXbxDbScxB-nYzfwLuGAiXiEhtqBZvX1XVxRO1uRa749v_VQero
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ZERO+MASK+HIGH+DENSITY+CAPACITOR&rft.inventor=WU+CHIA+TIEN&rft.inventor=HSIEH+CHENG+HSIANG&rft.inventor=CHEN+CHUNG+HUI&rft.inventor=CHEN+WAN+TE&rft.date=2020-12-03&rft.externalDBID=A&rft.externalDocID=KR20200135719A