ZERO MASK HIGH DENSITY CAPACITOR
Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A secon...
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Format | Patent |
Language | English Korean |
Published |
03.12.2020
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Subjects | |
Online Access | Get full text |
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Abstract | Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A second resistive layer is formed on an upper portion of the dielectric layer.
추가 마스크의 사용을 제거하는 방법 및 반도체 다바이스가 본 명세서에 설명된다. 제 1 상호 접속 층이 형성된다. 제 1 상호 접속 층의 상부에 제 1 저항 층이 형성된다. 제 1 저항 층의 상부에 유전체 층이 형성된다. 유전체 층의 상부에 제 2 저항 층이 형성된다. |
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AbstractList | Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is formed on an upper portion of the first interconnect layer. A dielectric layer is formed on an upper portion of the first resistive layer. A second resistive layer is formed on an upper portion of the dielectric layer.
추가 마스크의 사용을 제거하는 방법 및 반도체 다바이스가 본 명세서에 설명된다. 제 1 상호 접속 층이 형성된다. 제 1 상호 접속 층의 상부에 제 1 저항 층이 형성된다. 제 1 저항 층의 상부에 유전체 층이 형성된다. 유전체 층의 상부에 제 2 저항 층이 형성된다. |
Author | CHEN CHUNG HUI WU CHIA TIEN CHEN WAN TE HSIEH CHENG HSIANG |
Author_xml | – fullname: WU CHIA TIEN – fullname: HSIEH CHENG HSIANG – fullname: CHEN CHUNG HUI – fullname: CHEN WAN TE |
BookMark | eNrjYmDJy89L5WRQiHIN8lfwdQz2VvDwdPdQcHH1C_YMiVRwdgxwdPYM8Q_iYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXx3kFGBkYGBobGpuaGlo7GxKkCAE89JF8 |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
DocumentTitleAlternate | 제로 마스크 고밀도 커패시터 |
ExternalDocumentID | KR20200135719A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_KR20200135719A3 |
IEDL.DBID | EVB |
IngestDate | Fri Nov 08 04:46:09 EST 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English Korean |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_KR20200135719A3 |
Notes | Application Number: KR20200027875 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&CC=KR&NR=20200135719A |
ParticipantIDs | epo_espacenet_KR20200135719A |
PublicationCentury | 2000 |
PublicationDate | 20201203 |
PublicationDateYYYYMMDD | 2020-12-03 |
PublicationDate_xml | – month: 12 year: 2020 text: 20201203 day: 03 |
PublicationDecade | 2020 |
PublicationYear | 2020 |
RelatedCompanies | TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
RelatedCompanies_xml | – name: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
Score | 3.2590568 |
Snippet | Provided are methods for eliminating use of additional masks, and semiconductor devices. A first interconnect layer is formed. A first resistive layer is... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | ZERO MASK HIGH DENSITY CAPACITOR |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201203&DB=EPODOC&locale=&CC=KR&NR=20200135719A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTZPTja3MDDXNU9KTtMF3QSrm5SSZKALPqnE3DIl1QJ87KKvn5lHqIlXhGkEE0MObC8M-JzQcvDhiMAclQzM7yXg8roAMYjlAl5bWayflAkUyrd3C7F1UYP2jo1AW0GN1VycbF0D_F38ndWcnW29g9T8gsBywNaOqbmhpSMzAyuwIW0Oyg-uYU6gfSkFyJWKmyADWwDQvLwSIQam7HxhBk5n2N1rwgwcvtApbyATmvuKRRgUolyD_BV8HYO9FTw83T0UXFz9gj1DIhWcHQMcnT1D_INEGZTdXEOcPXSBVsXDfRbvHYTsLmMxBhZgnz9VgkEhxcjE1NQs1cg0Cdj9SjJPSkwzNU4xTgNtSzMyTE00lGSQwWeSFH5paQYuEBe8KsNYhoGlpKg0VRZYt5YkyYGDBAAsMHfH |
link.rule.ids | 230,309,783,888,25576,76876 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qFetNq-KjakDJLdgkTbc9BEk3iYlpHqRRWi-hmweIYouN-PfdXVLtqbdlB2Yf8O3s7M43A3CXoSxDgy6SEMlKiVWClUhOuhLPVIKGeTHgaRf9oO88956m2rQBH2suDM8T-sOTI1JEZRTvFT-vl_-PWCaPrVzdkzfatXiwE90Ua-9YYVRQVTRHuhWFZohFjHUvFoOYy-htR0Py0NiBXXrJRgwP1suI8VKWm0bFPoS9iOr7rI6g8b5oQwuva6-1Yd-vv7xps0bf6hiEVysOBd-YeILjPjqCaQUTN5kJ2IgM7CZhfAK3tpVgR6JDpX8rS714c17qKTSpz1-cgZArPU3rF4pGqPtFEJmXmpqrJaOlKXIxl8-hs03TxXbxDbScxB-nYzfwLuGAiXiEhtqBZvX1XVxRO1uRa749v_VQero |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ZERO+MASK+HIGH+DENSITY+CAPACITOR&rft.inventor=WU+CHIA+TIEN&rft.inventor=HSIEH+CHENG+HSIANG&rft.inventor=CHEN+CHUNG+HUI&rft.inventor=CHEN+WAN+TE&rft.date=2020-12-03&rft.externalDBID=A&rft.externalDocID=KR20200135719A |