TEST APPARATUS TEST METHOD AND INTERFACE UNIT

The present invention provides a test apparatus and a test method which can efficiently test a device difficult to support external synchronous control. The test apparatus (200) tests a DUT (110) impossible to support external synchronous control. A main controller (210) is based on an architecture...

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Bibliographic Details
Main Authors HARADA YUICHIRO, INAGE SHUICHI, IEZUMI KAZUHIRO, ITAKURA TOMOYUKI, KATO YOSHIHIRO, MIYAUCHI KOJI, KIMURA NAOYA, KUSUNOKI KEISUKE, TSUJIKAWA KAZUHIRO, WATANABE YUKI
Format Patent
LanguageEnglish
Korean
Published 23.07.2020
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention provides a test apparatus and a test method which can efficiently test a device difficult to support external synchronous control. The test apparatus (200) tests a DUT (110) impossible to support external synchronous control. A main controller (210) is based on an architecture that supports synchronous control with the main controller (210) itself as the master. An MIU (220) is arranged between the main controller (210) and the DUT (110), establishes asynchronous control between the main controller (210) and the DUT (110) with the DUT (110) as the master, and establishes control between the main controller (210) and the MIU (220) with the main controller (210) as the master. <과제> 외부로부터 동기 제어하기 어려운 디바이스를 효율적으로 시험 가능한 시험 장치, 시험 방법을 제공한다. <해결 수단> 시험 장치(200)는, 외부로부터의 동기 제어가 불가능한 DUT(110)를 검사 대상으로 한다. 메인 컨트롤러(210)는, 그 자체가 주도권을 갖는 동기 제어에 의해 디바이스를 검사하는 아키텍처를 베이스로 하고 있다. MIU(220)는, 메인 컨트롤러(210)와 DUT(110) 사이에 개재하고, DUT(110)와의 사이에서, DUT(110)가 주도권을 갖는 비동기 제어를 성립시키면서, 메인 컨트롤러(210)와의 사이에서, 메인 컨트롤러(210)가 주도권을 갖는 제어를 성립시킨다.
Bibliography:Application Number: KR20190117944