TEST HANDLER

The present invention relates to a test handler. According to the present invention, the test handler forms an inlet through which external air may be introduced into a wall of one side of a desoak chamber and has a switch capable of opening and closing the inlet. According to the present invention,...

Full description

Saved in:
Bibliographic Details
Main Authors KWEON YOUNG HO, NA YUN SUNG, KO DEOK SIN
Format Patent
LanguageEnglish
Korean
Published 17.06.2020
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:The present invention relates to a test handler. According to the present invention, the test handler forms an inlet through which external air may be introduced into a wall of one side of a desoak chamber and has a switch capable of opening and closing the inlet. According to the present invention, since the external air at room temperature can be supplied to the interior of the desoak chamber, semiconductor elements in the desoak chamber can be quickly recovered in a high temperature test, thereby quickly responding to the change of a test mode. 본 발명은 테스트핸들러에 관한 것이다. 본 발명에 따른 테스트핸들러는 디소크챔버 일 측 벽에 외기가 유입될 수 있는 유입구를 형성하고, 유입구를 개폐할 수 있는 개폐기를 구비한다. 본 발명에 따르면 상온의 외기가 다량으로 디소크챔버의 내부로 공급될 수 있기 때문에 고온 테스트 시에 디소크챔버 내의 반도체소자들이 빠른 시간 내에 온도 회복될 수 있고, 테스트 모드의 전환시에도 빠르게 대응할 수 있다.
Bibliography:Application Number: KR20200064739