Artificial Intelligence Enabled Metrology

Disclosed are a method and system for realizing artificial intelligence enabled instrumentation. According to an embodiment of the present invention, the method comprises the steps of: dividing a first image of a structure into one or more classes to form an at least partially segmented image; assoc...

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Bibliographic Details
Main Authors LARSON BRAD, MILLER THOMAS G, FLANAGAN JOHN J
Format Patent
LanguageEnglish
Korean
Published 11.05.2020
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:Disclosed are a method and system for realizing artificial intelligence enabled instrumentation. According to an embodiment of the present invention, the method comprises the steps of: dividing a first image of a structure into one or more classes to form an at least partially segmented image; associating at least one class of the at least partially segmented image with a second image; and performing measurement on the second image based on the association with the at least one class of the at least partially segmented image. 인공 지능 가능한 계측을 구현하기 위한 방법 및 시스템이 개시된다. 예시적인 방법은 적어도 부분적으로 분할된 이미지를 형성하기 위해 구조물의 제1 이미지를 하나 이상의 클래스로 분할하는 단계, 적어도 부분적으로 분할된 이미지의 적어도 하나의 클래스를 제2 이미지와 연관시키는 단계, 및 적어도 부분적으로 분할된 이미지의 적어도 하나의 클래스와의 연관에 기초하여 제2 이미지 상의 계측을 수행하는 단계를 포함한다.
Bibliography:Application Number: KR20190126241