SEMICONDUCTOR DEVICE
According to an embodiment of the present invention, disclosed is a semiconductor element capable of improving a low current yield and reducing operating voltage by adjusting a thickness of a first conductive semiconductor layer. The semiconductor element comprises: a first conductive semiconductor...
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Main Authors | , |
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Format | Patent |
Language | English Korean |
Published |
12.03.2020
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Subjects | |
Online Access | Get full text |
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Summary: | According to an embodiment of the present invention, disclosed is a semiconductor element capable of improving a low current yield and reducing operating voltage by adjusting a thickness of a first conductive semiconductor layer. The semiconductor element comprises: a first conductive semiconductor layer including Al; a second conductive semiconductor layer including Al; and an active layer disposed between the first conductive semiconductor layer and the second conductive semiconductor layer, and including Al.
실시 예는 제1 도전형 반도체층의 두께를 조절함으로써 저전류 수율을 개선하고 동작 전압을 낮출 수 있는 반도체 소자를 개시한다. |
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Bibliography: | Application Number: KR20180105356 |