PROBE CARD AND TEST DEVICE INCLUDING THE SAME

The present invention relates to a probe card and to a test device including the same. According to an embodiment of the present invention, the probe card comprises: a probe substrate; a plurality of cables provided on the probe substrate; a plurality of pins provided on the probe substrate and elec...

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Bibliographic Details
Main Author JANG TAE YONG
Format Patent
LanguageEnglish
Korean
Published 11.03.2020
Subjects
ADVERTISING
ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION
CRYPTOGRAPHY
DISPLAY
EDUCATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEALS
TESTING
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Summary:The present invention relates to a probe card and to a test device including the same. According to an embodiment of the present invention, the probe card comprises: a probe substrate; a plurality of cables provided on the probe substrate; a plurality of pins provided on the probe substrate and electrically connected to the plurality of cables; and a conductive line provided on the probe substrate and connected to a ground line. According to the present invention, by reducing a leakage current of the probe card, electrical characteristics for a display element can be precisely tested. 본 발명은 프로브 카드 및 이를 포함하는 테스트 장치에 관한 것이다. 본 발명의 실시예에 의한 프로브 카드는, 프로브 기판; 상기 프로브 기판 상에 제공되는 복수의 케이블; 상기 프로브 기판 상에 제공되며, 상기 복수의 케이블과 전기적으로 연결되는 복수의 핀; 및 상기 프로브 기판 상에 제공되며 접지선에 연결된 도전성 라인을 포함할 수 있다.
Bibliography:Application Number: KR20180102248