ANTI-REFLECTIVE FILM

The present invention relates to an anti-reflective film which shows one or more peaks in a scattering vector (q_max) of 0.0758-0.1256 nm^-1 in a graph of a log value of scattering intensity with respect to a scattering vector defined in small angle scattering by X-ray irradiation. 본 발명은, X선 조사에 의한...

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Bibliographic Details
Main Authors LEE JEONGKYU, JANG SEOKHOON, KIM BOO KYUNG, BYUN JINSEOK, CHANG YEONGRAE
Format Patent
LanguageEnglish
Korean
Published 26.04.2019
Subjects
CHEMISTRY
COMPOSITIONS BASED THEREON
COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
METALLURGY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
ORGANIC MACROMOLECULAR COMPOUNDS
PHYSICS
THEIR PREPARATION OR CHEMICAL WORKING-UP
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Summary:The present invention relates to an anti-reflective film which shows one or more peaks in a scattering vector (q_max) of 0.0758-0.1256 nm^-1 in a graph of a log value of scattering intensity with respect to a scattering vector defined in small angle scattering by X-ray irradiation. 본 발명은, X선 조사에 의한 소각 산란에서 정의되는 산란 벡터에 대한 산란 강도의 log값의 그래프에서, 0.0758 내지 0.1256 ㎚의 산란 벡터(q)에서 1개 이상의 피크를 나타내는, 반사 방지 필름에 관한 것이다.
Bibliography:Application Number: KR20190045687