Method of depositing thin film

The present invention provides a method of depositing a thin film capable of improving the coating rate. The method comprises: a first adsorption step of adsorbing a deposition control gas containing silicon on a substrate on which a pattern is formed; a second adsorption step of adsorbing a first p...

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Bibliographic Details
Main Authors KIM, JIN HO, LEE, SANG JIN, SON, BYOUNG GUK, PARK, SANG JUN
Format Patent
LanguageEnglish
Korean
Published 10.12.2018
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Summary:The present invention provides a method of depositing a thin film capable of improving the coating rate. The method comprises: a first adsorption step of adsorbing a deposition control gas containing silicon on a substrate on which a pattern is formed; a second adsorption step of adsorbing a first process gas containing silicon on the substrate after the first adsorption step; and a reaction step of forming a thin film on the pattern by supplying the deposition control gas adsorbed on the substrate and a second process gas reacting with the first process gas after the second adsorption step. The reaction rate between the first process gas and the second process gas is faster than the reaction rate between the deposition control gas and the second process gas. 본 발명은 패턴이 형성된 기판 상에 실리콘을 포함하는 증착조절가스를 흡착시키는 제1 흡착단계; 상기 제1 흡착단계 후 상기 기판 상에 실리콘을 포함하는 제1 공정가스를 흡착시키는 제2 흡착단계; 상기 제2 흡착단계 후 상기 기판 상에 흡착된 증착조절가스 및 상기 제1 공정가스와 반응하는 제2 공정가스를 공급하여 상기 패턴에 박막을 형성하는 반응 단계;를 포함하며, 상기 제1 공정가스와 상기 제2 공정가스 간의 반응속도는 상기 증착조절가스와 상기 제2 공정가스 간의 반응속도 보다 빠른 것을 특징으로 하는 박막 증착 방법을 제공한다.
Bibliography:Application Number: KR20170067141