SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM
The present invention provides a semiconductor device capable of efficiently providing a voltage margin in consideration of a trend according to deterioration of a transistor, and a semiconductor system. The semiconductor device comprises: a monitoring circuit receiving first operation voltage and s...
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Main Authors | , , , , , |
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Format | Patent |
Language | English Korean |
Published |
16.08.2018
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Subjects | |
Online Access | Get full text |
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Summary: | The present invention provides a semiconductor device capable of efficiently providing a voltage margin in consideration of a trend according to deterioration of a transistor, and a semiconductor system. The semiconductor device comprises: a monitoring circuit receiving first operation voltage and second operation voltage different from the first operation voltage from a power management integrated circuit (PMIC), and monitoring a usage time for each operation time in a system on chip (SoC) operated by the operation voltage; a processing circuit calculating the usage time for each operation voltage as a normalized vale by using predetermined weight information; and a voltage circuit comparing the normalized value with a predetermined value, and determining whether to increase the operation voltage.
반도체 장치 및 반도체 시스템이 제공된다. 반도체 장치는 전력 관리 IC(Power Management Integrated Circuit, PMIC)로부터 제1 동작 전압 및 상기 제1 동작 전압과 다른 제2 동작 전압을 제공받고, 상기 동작 전압으로 동작하는 시스템 온 칩(System on Chip, SoC)에서, 동작 전압 별 사용 시간을 모니터링하는 모니터링 회로; 미리 결정된 가중치 정보를 이용하여 상기 동작 전압 별 사용 시간을 정규화된 값(normalized value)으로 연산하는 처리 회로; 및 상기 정규화된 값을 미리 결정된 값과 비교하여 상기 동작 전압을 증가시킬 지 여부를 결정하는 전압 회로를 포함한다. |
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Bibliography: | Application Number: KR20170016880 |