PROBE APPARATUS

The present invention relates to a probe apparatus. The probe apparatus according to an embodiment of the present invention includes a cable including a signal terminal and a ground terminal, a probe tip electrically connected to the signal terminal and transmitting an electrical signal, and an elas...

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Bibliographic Details
Main Authors HAN, SANG HO, LEE, JAE CHAN, JEONG, JAE YOUN, CHOI, MIN SOO, WEE, HYE RAN, KANG, YOUNG GU
Format Patent
LanguageEnglish
Korean
Published 17.04.2018
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention relates to a probe apparatus. The probe apparatus according to an embodiment of the present invention includes a cable including a signal terminal and a ground terminal, a probe tip electrically connected to the signal terminal and transmitting an electrical signal, and an elastic body coupled to one side of the probe tip. A plurality of cables, probe tips, and elastic bodies are formed. The elastic bodies are connected to the probe tips, respectively. Accordingly, the present invention can offset the deviation of contact pressure. 본 발명은 프로브 장치에 관한 것이다. 본 발명의 일 실시예에 따른 프로브 장치는 시그널 단자와 그라운드 단자를 포함하는 케이블, 상기 시그널 단자와 전기적으로 연결되고 전기적 신호를 전달하는 프로브 팁 및 상기 프로브 팁의 일측에 결합되는 탄성체를 포함하되, 상기 케이블, 상기 프로브 팁 및 상기 탄성체는 복수로 형성되고, 상기 탄성체는 상기 프로브 팁과 각각 연결될 수 있다.
Bibliography:Application Number: KR20160130054