SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

In a method of manufacturing a semiconductor device, a first interlayer dielectric layer is formed on a substrate. A first concave part is formed in the first interlayer dielectric layer. A first metal line is formed in a first concave part. A first etching resistance layer is formed on the surface...

Full description

Saved in:
Bibliographic Details
Main Authors CHAO CHA HSIN, HER JENG CHANG, CHIU YI WEI, HSU LI TE, HSIA YING TING
Format Patent
LanguageEnglish
Korean
Published 04.04.2018
Subjects
Online AccessGet full text

Cover

Loading…