SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
In a method of manufacturing a semiconductor device, a first interlayer dielectric layer is formed on a substrate. A first concave part is formed in the first interlayer dielectric layer. A first metal line is formed in a first concave part. A first etching resistance layer is formed on the surface...
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Main Authors | , , , , |
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Format | Patent |
Language | English Korean |
Published |
04.04.2018
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Subjects | |
Online Access | Get full text |
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