PROBE-PIN WITH SPRING

The present invention relates to a spring probe pin which is used for inspecting electric properties of a semiconductor, electronic equipment and the like and is easy to manufacture and maintain because a top plunger and a bottom plunger are coupled with an elastic spring. To this end, the spring pr...

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Bibliographic Details
Main Author LEE, BYUNG SUNG
Format Patent
LanguageEnglish
Korean
Published 09.03.2018
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention relates to a spring probe pin which is used for inspecting electric properties of a semiconductor, electronic equipment and the like and is easy to manufacture and maintain because a top plunger and a bottom plunger are coupled with an elastic spring. To this end, the spring probe pin comprises: a probe part (10) which is in contact with an inspection region; a coupling spring (20) located between the probe part (10) and a jig mounting part (30), and providing an elastic force; and the jig mounting part (30) coupled to a jig for inspection. 본 발명은 스프링 프로브핀에 대한 것으로, 반도체 및 전자장비 등의 전기적인 특성을 검사할 때 사용되는 것으로, 탑플런저와 바텀플런저를 탄성스프링으로 결합하여 제조 및 유지보수가 용이한 프로브핀을 제공하는 것이다. 이를 위해, 스프링 프로브핀은 검사부위에 접촉되는 탐침부(10)와 상기 탐침부(10)와 지그장착부(30)의 사이에 위치하여 탄성력을 제공하는 결합스프링(20) 및 검사용 지그에 결합되는 지그장착부(30)로 구성되는 스프링 프로브핀을 제공하게 된다.
Bibliography:Application Number: KR20160112737