SURFACE STATE MONITORING APPARATUS FOR METALLIC BODY AND SURFACE STATE MONITORING METHOD FOR METALLIC BODY

• Main Authors: AKAGI TOSHIO, YAMAJI HIRONAO, UMEMURA JUN, KONNO YUSUKE
• Format: Patent
• Language: English; Korean
• Published: 20.11.2017
• Subjects: CALCULATING; COLORIMETRY; COMPUTING; COUNTING; ELECTRIC COMMUNICATION TECHNIQUE; ELECTRIC DIGITAL DATA PROCESSING; ELECTRICITY; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; PICTORIAL COMMUNICATION, e.g. TELEVISION; RADIATION PYROMETRY; TESTING

금속체 표면의, 특정 색상을 갖는 영역과, 특정 색상을 갖지 않고, 표면의 조도가 변화되어 있는 영역을 감시한다. 광축이 금속체 표면의 법선 방향과 대략 평행한 라인 센서 카메라와, 금속체 표면에 띠 형상의 조명광을 조사하는 제1, 제2 및 제3 조명 광원을 갖고, 조사한 3개의 조명광의 각 반사광을 각각 구별하여 측정하는 측정 장치와, 반사광의 휘도값에 기초하여 표면 상태 감시 정보를 연산하는 연산 처리 장치를 구비한다. 제2 및 제3 조명 광원은, 각 광축과 라인 센서 카메라의 광축이 이루는 제2 각도와 제3 각도가 대략 동등해지도록 배치되고, 제1 조명 광원은, 라인 센서 카메라의 광축과 제1 조명 광원의 광축이 이루는 제1 각도가 제2 각도보다 커지도록 배치된다. 연산 처리 장치는, 제1 조명광의 반사광의 휘도값으로부터 금속체 표면의 색상에 관한 정보와, 제2 및 제3 조명광의 각 반사광의 휘도값으로부터 금속체의 표면 조도에 관한 정보를 연산한다. [Object] To monitor, on a metallic body surface, a region that has a specific hue and a region that does not have the specific hue and has a surface whose roughness varies. [Solution] Included are: a measurement apparatus which includes a line sensor camera which is provided such that an optical axis of the line sensor camera is substantially parallel to a normal direction of a metallic body surface, and first, second, and third illumination light sources each configured to irradiate the metallic body surface with first, second, and third illumination light beams each having a strip shape, the measurement apparatus being configured to measure separately respective reflected light beams of the three illumination light beams that have been emitted; and an arithmetic processing apparatus configured to calculate surface state monitoring information on the basis of luminance values of the reflected light beams. The second and third illumination light sources are provided such that a second angle between an optical axis of the second illumination light source and the optical axis of the line sensor camera is substantially equal to a third angle between an optical axis of the third illumination light source and the optical axis of the line sensor camera, and the first illumination light source is provided such that a first angle between the optical axis of the line sensor camera and an optical axis of the first illumination light source is larger than the second angle. The arithmetic processing apparatus calculates information on a hue of the metallic body surface on the basis of a luminance value of the reflected light beam of the first illumination light beam and information on surface roughness of the metallic body on the basis of luminance values of the respective reflected light beams of the second and third illumination light beams.