INSPECTION TERMINAL UNIT PROBE CARD AND METHOD FOR MANUFACTURING INSPECTION TERMINAL UNIT

일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspe...

Full description

Saved in:
Bibliographic Details
Main Authors TERANISHI HIROTADA, SAKAI TAKAHIRO, OZAKI HIDEAKI
Format Patent
LanguageEnglish
Korean
Published 10.03.2017
Subjects
Online AccessGet full text

Cover

Loading…
Abstract 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion (25) at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate (3), and a holding unit (30) that integrally holds at least the two inspection pins (20).
AbstractList 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion (25) at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate (3), and a holding unit (30) that integrally holds at least the two inspection pins (20).
Author OZAKI HIDEAKI
TERANISHI HIROTADA
SAKAI TAKAHIRO
Author_xml – fullname: TERANISHI HIROTADA
– fullname: SAKAI TAKAHIRO
– fullname: OZAKI HIDEAKI
BookMark eNrjYmDJy89L5WSI9PQLDnB1DvH091MIcQ3y9fRz9FEI9fMMUQgI8ndyVXB2DHJRcPRzUfB1DfHwd1Fw8w9S8HX0C3VzdA4JDfL0c1fAZQAPA2taYk5xKi-U5mZQdnMNcfbQTS3Ij08tLkhMTs1LLYn3DjIyMDQ3MDAytzA0dzQmThUAQqI0UQ
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 검사 단자 유닛 및 프로브 카드 및 검사 단자 유닛의 제조 방법
ExternalDocumentID KR20170027817A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20170027817A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:49:16 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Korean
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20170027817A3
Notes Application Number: KR20177002840
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170310&DB=EPODOC&CC=KR&NR=20170027817A
ParticipantIDs epo_espacenet_KR20170027817A
PublicationCentury 2000
PublicationDate 20170310
PublicationDateYYYYMMDD 2017-03-10
PublicationDate_xml – month: 03
  year: 2017
  text: 20170310
  day: 10
PublicationDecade 2010
PublicationYear 2017
RelatedCompanies OMRON CORPORATION
RelatedCompanies_xml – name: OMRON CORPORATION
Score 3.0389218
Snippet 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Title INSPECTION TERMINAL UNIT PROBE CARD AND METHOD FOR MANUFACTURING INSPECTION TERMINAL UNIT
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170310&DB=EPODOC&locale=&CC=KR&NR=20170027817A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_HzTqfgxJaD0rbh-bO0ehnRJy3T2g9LJfBpN24Eo3XAV_30vcdO9uMdc4EjCXS6_5HcXgFu0CXuaZpqqdxHpmJmlq9223VVznlsdtDBupSLB2Q86g5H5OG6Pa_C-yoWRdUK_ZHFE9KgM_b2S-_X87xKLSW7l4o6_omh27yU9pizRsSaqsbcU1u-5UchCqlDaG8ZKEP_0iVc2zXK2YBsP0pbwB_e5L_JS5utBxTuEnQj1ldUR1N5mDdinq7_XGrDnL5-8G7ArOZrZAoVLP1wcwwti7siV_A-C51H_IXCeCEK5hERx2HcJdWJGnIAR300GISMI9YjvBCPPoclI8B_IfwpO4MZzEzpQcbST38WZDOP1qRmnUC9nZXEGxJjmtp3qeitPczPTbK5xxCa8lRlTPeXt4hyamzRdbO6-hAPRVCWzrQn16uOzuMLwXPFruarfIDuLYg
link.rule.ids 230,309,783,888,25576,76876
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfuCbosYP1CaavS2y8bHxQMxotwxhH1mGwadl3SAxGiAy47_vtYLyIq-95NJeer37tb-7AtzjnjCnaaapegeRTjMzdLXTMjtqznOjjTuMG6kocPb8tjtqPo1b4xK8r2thZJ_QL9kcET0qQ38v5Hm9-LvEYpJbuXzgrzg0f3TiLlNW6FgT3djrCut17TBgAVUo7Q4ixY9-ZOKVTTOsHdjFJNsQ_mA_90RdymIzqDhHsBeivllxDKW3eRUqdP33WhUOvNWTdxX2JUczW-Lgyg-XJ_CCmDu0Jf-DYD7q9X1rSBDKxSSMgp5NqBUxYvmMeHbsBowg1COe5Y8ci8YjwX8g_yk4hTvHjqmr4myTX-Mkg2hzaY0zKM_ms8k5kMY0N81U1-t5mjczzeQaR2zC61ljqqe8NbmA2jZNl9vFt1BxY2-YDPv-4AoOhUiVLLcalIuPz8k1huqC30gLfwPW2Y5V
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=INSPECTION+TERMINAL+UNIT+PROBE+CARD+AND+METHOD+FOR+MANUFACTURING+INSPECTION+TERMINAL+UNIT&rft.inventor=TERANISHI+HIROTADA&rft.inventor=SAKAI+TAKAHIRO&rft.inventor=OZAKI+HIDEAKI&rft.date=2017-03-10&rft.externalDBID=A&rft.externalDocID=KR20170027817A