INSPECTION TERMINAL UNIT PROBE CARD AND METHOD FOR MANUFACTURING INSPECTION TERMINAL UNIT
일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspe...
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Main Authors | , , |
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Format | Patent |
Language | English Korean |
Published |
10.03.2017
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Subjects | |
Online Access | Get full text |
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Abstract | 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛.
An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion (25) at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate (3), and a holding unit (30) that integrally holds at least the two inspection pins (20). |
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AbstractList | 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛.
An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion (25) at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate (3), and a holding unit (30) that integrally holds at least the two inspection pins (20). |
Author | OZAKI HIDEAKI TERANISHI HIROTADA SAKAI TAKAHIRO |
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DocumentTitleAlternate | 검사 단자 유닛 및 프로브 카드 및 검사 단자 유닛의 제조 방법 |
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Snippet | 일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛.
An inspection terminal... |
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SubjectTerms | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
Title | INSPECTION TERMINAL UNIT PROBE CARD AND METHOD FOR MANUFACTURING INSPECTION TERMINAL UNIT |
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