INSPECTION TERMINAL UNIT PROBE CARD AND METHOD FOR MANUFACTURING INSPECTION TERMINAL UNIT

일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspe...

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Bibliographic Details
Main Authors TERANISHI HIROTADA, SAKAI TAKAHIRO, OZAKI HIDEAKI
Format Patent
LanguageEnglish
Korean
Published 10.03.2017
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:일단에 피검사 소자에 접촉하는 접촉부를 가지며, 또한, 타단에 기판(3)에 접속되는 접속부(25)를 갖는 적어도 2개의 검사핀(20)과, 병설한 적어도 2개의 상기 검사핀(20)을 일체로 유지하는 유지부(30)를 구비한 검사 단자 유닛. An inspection terminal unit includes at least two inspection pins (20), which are arrayed side by side, each of which has a contact portion at a first end of the inspection pin and a connection portion (25) at a second end of the inspection pin, the contact portion being in contact with an inspection object element and the connection portion being connected to a substrate (3), and a holding unit (30) that integrally holds at least the two inspection pins (20).
Bibliography:Application Number: KR20177002840