SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF

A semiconductor device according to the present technique includes a first latch for storing data outputted from a memory cell in a first operation; and a fail detection part for detecting fail by comparing the data stored in the latch with the data outputted from the memory cell by a second operati...

Full description

Saved in:
Bibliographic Details
Main Authors KIM, TAE KYUN, CHOI, JUN GI
Format Patent
LanguageEnglish
Korean
Published 11.01.2017
Subjects
INFORMATION STORAGE
PHYSICS
STATIC STORES
Online AccessGet full text

Cover

More Information
Summary:A semiconductor device according to the present technique includes a first latch for storing data outputted from a memory cell in a first operation; and a fail detection part for detecting fail by comparing the data stored in the latch with the data outputted from the memory cell by a second operation performed after a predetermined time after the first operation. So, intermittent fails are detected during the operation of the memory cell. 본 기술에 의한 반도체 장치는 제 1 동작 시 메모리 셀에서 출력되는 데이터를 저장하는 제 1 래치; 및 제 1 동작 후 일정 시간 이후 수행되는 제 2 동작에 의해 메모리 셀에서 출력되는 데이터와 래치에 저장된 데이터를 비교하여 페일을 탐지하는 페일 탐지부를 포함한다.
Bibliography:Application Number: KR20150094512