METHOD, DEVICE AND COMPUTER PROGRAM PRODUCT FOR CIRCUIT TESTING

A method performed at least partially by a processor comprises a step of performing a test sequence. In the test sequence, a test pattern is loaded into a circuit. The test pattern is configured to cause the circuit to output a predetermined test response. A test response is unloaded from the circui...

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Bibliographic Details
Main Authors GOEL SANDEEP KUMAR, ADHAM SAMAN M. I, LEE YUN HAN
Format Patent
LanguageEnglish
Korean
Published 26.09.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A method performed at least partially by a processor comprises a step of performing a test sequence. In the test sequence, a test pattern is loaded into a circuit. The test pattern is configured to cause the circuit to output a predetermined test response. A test response is unloaded from the circuit after a test wait time period has passed since the loading of the test pattern into the circuit. The unloaded test response is compared with the predetermined test response. 프로세서에 의해 적어도 부분적으로 수행되는 방법은 시험 시컨스를 수행하는 단계를 포함한다. 시험 시컨스에서, 시험 패턴이 회로에 로딩된다. 시험 패턴은 회로가 미리 정해진 시험 응답을 출력하게 하도록 구성된다. 시험 응답은, 시험 패턴을 회로에 로딩한 이후에, 시험 대기 기간이 경과한 후에 회로로부터 언로딩된다. 언로딩된 상기 시험 응답은 미리 정해진 시험 응답과 비교된다.
Bibliography:Application Number: KR20150096667