TESTING METHOD OF MOTHER SUBSTRATE FOR DISPLAY DEVICE

The present invention is to provide a mother substrate for a display device capable of testing an error pixel by arranging a gate driving part for testing in the dummy part of the mother substrate, and a testing method thereof. The gate driving part for testing includes a first to an n^th gate inter...

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Bibliographic Details
Main Author GANG, BYEONG UK
Format Patent
LanguageEnglish
Korean
Published 10.08.2016
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The present invention is to provide a mother substrate for a display device capable of testing an error pixel by arranging a gate driving part for testing in the dummy part of the mother substrate, and a testing method thereof. The gate driving part for testing includes a first to an n^th gate internal circuit. The first to the n^th gate internal circuit successively outputs a first to an n^th gate signal to a first to an n^th gate line, performs test, and removes the dummy part. So, the time required for the test can be reduced. 본 발명은 모기판의 더미부에 검사용 게이트 구동부를 배치하여 불량 화소를 검사할 수 있는 표시장치용 모기판 및 이의 검사방법을 제공하기 위한 것으로, 검사용 게이트 구동부는 제1 내지 제n게이트 내장회로를 포함하며, 상기 제1 내지 제n게이트 내장회로는 상기 제1 내지 제n게이트 배선에 제1 내지 제n게이트신호를 순차적으로 출력하여 검사를 진행하고, 이후 더미부를 제거한다.
Bibliography:Application Number: KR20150015050