INTERFACE TREATMENT OF SEMICONDUCTOR SURFACES WITH HIGH DENSITY LOW ENERGY PLASMA

Ge 또는 III-V 족 화합물 반도체 재료들을 함유하는 반도체 표면들의 소프트 플라즈마 표면 처리에서, 전자 빔 플라즈마 소스가 사용된다. An electron beam plasma source is used in a soft plasma surface treatment of semiconductor surfaces containing Ge or group III-V compound semiconductor materials....

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Main Authors DORF LEONID, NAINANI ANEESH, ZOPE BHUSHAN N, ABRAHAM MATHEW, DESHMUKH SUBHASH, BRAND ADAM, RAUF SHAHID
Format Patent
LanguageEnglish
Korean
Published 13.06.2016
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Summary:Ge 또는 III-V 족 화합물 반도체 재료들을 함유하는 반도체 표면들의 소프트 플라즈마 표면 처리에서, 전자 빔 플라즈마 소스가 사용된다. An electron beam plasma source is used in a soft plasma surface treatment of semiconductor surfaces containing Ge or group III-V compound semiconductor materials.
Bibliography:Application Number: KR20167011702