ILLUMINATION INTENSITY CONTROL FOR INSPECTION SYSTEM

A device (10) includes a solid state lighting source (15) for inspecting an object, and a circuit (20, 64, 68, 22, 43, 45, 50, 55) which performs an initial correction process for selecting a fixed voltage supply level to be applied to the solid state lighting source, and applies the sequence of a v...

Full description

Saved in:
Bibliographic Details
Main Authors SAPHIER OFER, DAVIDI YAAKOV
Format Patent
LanguageEnglish
Korean
Published 02.06.2016
Subjects
BLASTING
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMSTHEREOF
HEATING
LIGHTING
MECHANICAL ENGINEERING
STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHERARTICLES, NOT OTHERWISE PROVIDED FOR
WEAPONS
Online AccessGet full text

Cover

More Information
Summary:A device (10) includes a solid state lighting source (15) for inspecting an object, and a circuit (20, 64, 68, 22, 43, 45, 50, 55) which performs an initial correction process for selecting a fixed voltage supply level to be applied to the solid state lighting source, and applies the sequence of a voltage pulse (110) having the selected fixed voltage supply level to the solid state lighting source, and generates the sequence of a fixed-strength lighting pulse for inspecting the object with the solid state lighting source. So, the device can control voltage and pulse duration time. 장치(10)는 물체의 검사를 위한 솔리드 스테이트 조명원(15), 및 솔리드 스테이트 조명원에 인가하기 위한 고정 전압 공급 레벨을 선택하는 초기 교정 프로세스를 수행하고, 솔리드 스테이트 조명원에 선택된 고정 전압 공급 레벨을 갖는 전압 펄스(110)의 시퀀스를 인가함으로써, 솔리드 스테이트 조명원이 물체를 검사하기 위한 고정-강도 조명 펄스의 시퀀스를 생성하도록 구성된 회로(20, 64, 68, 22, 43, 45, 50, 55)를 포함한다.
Bibliography:Application Number: KR20150164375