DRIVING INTEGRATED CIRCUIT, DISPLAY APPARATUS COMPRISING THEREOF AND METHOD OF MEASURING BONDING RESISTOR

The present invention relates to driving integrated circuits, a display device comprising thereof and a method for measuring boding resistance by using driving integrated circuits. The driving integrated circuits according to the present invention comprise: multiple connection contact pad bonded wit...

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Bibliographic Details
Main Author MOON, JONG WON
Format Patent
LanguageEnglish
Korean
Published 22.07.2015
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Summary:The present invention relates to driving integrated circuits, a display device comprising thereof and a method for measuring boding resistance by using driving integrated circuits. The driving integrated circuits according to the present invention comprise: multiple connection contact pad bonded with a mounting area of a display panel and electrically connected to multiple signal pads installed in the mounting area; at least one test contact pad electrically connected to at least one test contact pad installed in the mounting area; and a resistance measuring unit that charges an external capacitor electrically connected to the test contact pad and a bonding area of the test contact pad and measures the bonding resistance of the bonding unit based on the discharging time of voltage or the magnitude of the charging voltage for the external capacitor. 본 발명은 구동집적회로, 이를 포함하는 표시장치 및 구동집적회로를 이용한 결합저항 측정 방법을 개시한다. 본 발명의 구동집적회로는, 표시패널의 실장영역에 본딩되고, 상기 실장영역에 구비된 복수의 신호 패드와 전기적으로 연결되는 복수의 연결 컨택 패드; 상기 실장 영역에 구비된 적어도 하나의 테스트 패드와 전기적으로 연결되는 적어도 하나의 테스트 컨택 패드; 및 상기 테스트 패드와 테스트 컨택 패드의 본딩부에 전기적으로 연결된 외부 커패시터를 충전하고, 상기 외부 커패시터의 충전전압의 크기 또는 충전전압의 방전시간을 기초로 상기 본딩부의 결합저항을 측정하는 저항측정부;를 포함할 수 있다.
Bibliography:Application Number: KR20140004707