DETECTION OF X-RAYS, AND X-RAY DETECTOR SYSTEM

A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regul...

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Bibliographic Details
Main Authors GOEDERER EDGAR, KREISLER BJOERN, STRASSBURG MATTHIAS, REINWAND MARIO, NIEDERLOEHNER DANIEL, WIRTH STEFAN, LABAYEN DE INZA MIGUEL, HACKENSCHMIED PETER, KAPPLER STEFFEN, SCHROETER CHRISTIAN
Format Patent
LanguageEnglish
Korean
Published 27.03.2015
Subjects
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Summary:A method is disclosed for detecting x-rays using an x-ray detector which includes a direct-conversion semiconductor detector element. Additional radiation is supplied to the semiconductor detector element using a radiation source, and the supply of the additional radiation is controlled and/or regulated on the basis of a specified target value. In at least one embodiment, the target value can be specified in a variable manner over time as a sequence of target values. An x-ray detector system is further disclosed, with which the method can be carried out.
Bibliography:Application Number: KR20157005307