3D MEASUREMENT APPARATUS AND METHOD

Disclosed in the present invention are a 3D shape measuring apparatus and a measuring method. For 3D shape measurement, in order to reflect reflection characteristics of each part of an object to be measured in a step of generating a phase-shifted fringe pattern, calculated is a matching pixel of a...

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Bibliographic Details
Main Authors CHOI, JAE MAN, HUR, JUN GYU
Format Patent
LanguageEnglish
Korean
Published 19.08.2014
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:Disclosed in the present invention are a 3D shape measuring apparatus and a measuring method. For 3D shape measurement, in order to reflect reflection characteristics of each part of an object to be measured in a step of generating a phase-shifted fringe pattern, calculated is a matching pixel of a pattern generation/projection unit which influences light exposed to a random fixed pixel point of an obtained image. The fringe pattern is corrected by correcting the intensity of the light at the pixel position of the fringe pattern which is calculated into the matching pixel. The fringe pattern which is corrected in order to reflect the reflection characteristics of each part of the object is projected to the object. The height information of the object is calculated using phase information of the distorted fringe pattern which is reflected from the object.
Bibliography:Application Number: KR20130014643