TUNING A PARAMETER ASSOCIATED WITH PLASMA IMPEDANCE

Disclosed are a system and a method for tuning plasma which is associated with a plasma impedance. One of methods includes a step of receiving information in order to determine a variable. Information is measured in a transmission line in case a parameter has a first value. The transmission line is...

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Bibliographic Details
Main Authors VALCORE JR. JOHN C, LYNDAKER BRADFORD J
Format Patent
LanguageEnglish
Korean
Published 21.07.2014
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Summary:Disclosed are a system and a method for tuning plasma which is associated with a plasma impedance. One of methods includes a step of receiving information in order to determine a variable. Information is measured in a transmission line in case a parameter has a first value. The transmission line is used when providing electric power to a plasma chamber. The method further includes the following steps of: determining whether a variable is in a local minimum value or not; and providing a first value in order to tune an impedance matching circuit in case the variable is in the local minimum value. The method also includes the following steps of: changing the first value into a second value of a parameter in case the variable is not in the local minimum value; and determining whether the parameter is in the local minimum value or not in case the parameter has the second value.
Bibliography:Application Number: KR20140004239