HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD OF FORMING THE SAME
A high electron mobility transistor (HEMT) includes a first III-V compound layer having a first band gap, and a second III-V compound layer having a second band gap over the first III-V compound layer. The second band gap is smaller than the first band gap. The HEMT further includes a third III-V co...
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Main Authors | , , , , |
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Format | Patent |
Language | English Korean |
Published |
14.07.2014
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Subjects | |
Online Access | Get full text |
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Summary: | A high electron mobility transistor (HEMT) includes a first III-V compound layer having a first band gap, and a second III-V compound layer having a second band gap over the first III-V compound layer. The second band gap is smaller than the first band gap. The HEMT further includes a third III-V compound layer having a third band gap over the second III-V compound layer, wherein the third band gap is greater than the first band gap. A gate electrode is formed over the third III-V compound layer. A source region and a drain region are over the third III-V compound layer and on opposite sides of the gate electrode. |
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Bibliography: | Application Number: KR20130042750 |