METHOD FOR MEASURING THICKNESS OF LAYER APPLIED FROM COSMETIC MATERIAL USING SKIN CONTOUR

• Main Authors: JEONG, CHOON BOK, PARK, SE JUN, KIM, HYE RIM, NAM, GAE WON, HAN, JI YEON, CHO, JUN CHEOL
• Format: Patent
• Language: English; Korean
• Published: 04.07.2014
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

A method for measuring the thickness of a cosmetic material-applied layer using skin curves comprises the following steps: a step of measuring curve data of a skin area which includes a first area without a cosmetic material-applied layer, and a second area with a cosmetic material-applied layer; a step of generating a 3D image of the skin area from the curve data; a step of determining a line profile area, which crosses the boundary line between the first area and the second area, in the 3D image; and a step of calculating the thickness of the cosmetic material-applied layer using a height difference according to the line profile area. By using the method for measuring the thickness of a cosmetic material-applied layer, the thickness of a cosmetic material-applied layer or a make-up-applied layer can be accurately and numerically assessed.