A PERFORMANCE CHARACTERISTIC MONITORING CIRCUIT AND METHOD

• Main Authors: HOLD BETINA, DWIVEDI SANDEEP
• Format: Patent
• Language: English; Korean
• Published: 22.01.2014
• Subjects: INFORMATION STORAGE; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; STATIC STORES; TESTING

Performance characteristic monitoring circuitry is disclosed, which is provided within a device to generate an output signal indicative of a performance characteristic of components of the device, the performance characteristic being dependent on one or more physical properties of the components of the device. The monitoring circuitry comprises first delay circuitry providing a first delay path, wherein transmission of a data value over the first delay path incurs a first delay that varies in dependence on the performance characteristic. Reference delay circuitry is also configured to provide a reference delay path, wherein transmission of the data value over the reference delay path incurs a reference delay. The reference delay circuitry includes components configured to provide a capacitive load on the reference delay path in order to produce a self-compensating effect on the reference delay that causes the reference delay to be less sensitive than the first delay to variation in the performance characteristic. Comparison circuitry is then used to generate the output signal of the monitoring circuitry in dependence on a comparison of the first delay and the reference delay. This type of monitoring circuitry can provide a small area and low-cost solution for monitoring the performance characteristic and also can be more readily scalable across different process technologies. [Reference numerals] (10) Inverter-based delay chain; (20) Self-compensating delay chain; (30) Comparison circuit; (AA) Process monitor output