LATCH-UP ROBUST SCR-BASED DEVICES

Disclosed is a latch-up robust SCR-based device. The embodiment include a step for providing a first N+ region and a first P+ region in a substrate for SCR; a step for providing a first n-wall region and a second n-wall region adjacent to the first N+ region and the first P+ region in the substrate;...

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Bibliographic Details
Main Author LAI DA WEI
Format Patent
LanguageEnglish
Korean
Published 10.12.2013
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:Disclosed is a latch-up robust SCR-based device. The embodiment include a step for providing a first N+ region and a first P+ region in a substrate for SCR; a step for providing a first n-wall region and a second n-wall region adjacent to the first N+ region and the first P+ region in the substrate; a step for providing a second N+ region in the first n-wall region and the second P+ region in the second n-wall region; a step for combining the first N+ region and the first P+ region with a ground rail, the second N+ region with a power rail, and the second P+ region with an I/O pad.
Bibliography:Application Number: KR20130059922