SENSING SUPPLY VOLTAGE SWINGS WITHIN AN INTEGRATED CIRCUIT

PURPOSE: A method of sensing supply voltage swings within an integrated circuit is provided to accurately monitor a supply voltage level within the integrated circuit in a high cell density area without excessively increasing electricity of the integrated circuit and an area condition. CONSTITUTION:...

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Bibliographic Details
Main Authors DAS SHIDHARTHA, WHATMOUGH PAUL NICHOLAS, BULL DAVID MICHAEL
Format Patent
LanguageEnglish
Korean
Published 10.07.2013
Subjects
CONTROLLING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
REGULATING
SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
TESTING
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Summary:PURPOSE: A method of sensing supply voltage swings within an integrated circuit is provided to accurately monitor a supply voltage level within the integrated circuit in a high cell density area without excessively increasing electricity of the integrated circuit and an area condition. CONSTITUTION: An integrated circuit (10) includes multiple sensors (30) for sensing a change of a supply voltage level in spots within the integrated circuit. The multiple sensors distributed throughout the integrated circuit include a transistor device for having a sensing result of a random voltage offset which has a predicted probability within a predetermined voltage offset range by a process change of the transistor device within the sensors. The integrated circuit is composed to deliver a result to a process circuit from a multi sensor from the multiple sensors, and the change of the supply voltage level is determined in a voltage offset range which is more reduced than the predetermined voltage offset range. [Reference numerals] (20) Power supply unit; (40) Process circuit
Bibliography:Application Number: KR20120150319