METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE

A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak...

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Bibliographic Details
Main Authors MAKINO BUNSHO, MORI YOSHIKAZU, NODA KEIICHI
Format Patent
LanguageEnglish
Korean
Published 22.03.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak pattern preparing part 7 preparing a peak pattern for each peak of the target FP and a reference FP that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, and a peak assigning part 9 specifying the peaks corresponding to each other by comparison of the peak patterns.
Bibliography:Application Number: KR20127032273