APPARATUS FOR INSPECTING LIGHT EMITTING DEVICE AND INSPECTING METHOD USING THE SAME

• Main Authors: JI, WON SOO, KIM, CHOO HO, KWON, OH SEOK
• Format: Patent
• Language: English; Korean
• Published: 09.10.2012
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SEMICONDUCTOR DEVICES; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PURPOSE: A light emitting diode inspecting device and an inspecting method thereof are provided to simplify inspection process. CONSTITUTION: A light emitting diode inspecting device(100) comprises a light emitting diode(110), a first illumination unit(120), a second illumination unit(130), an image photographic unit, and a determining unit(170). The light emitting diode comprises fluorescent material on a light emitting face. The first illumination unit radiates visible rays to the light emitting diode. The second illumination unit radiates ultraviolet rays to the light emitting diode. The image photographic unit takes a photograph of the visible rays reflected from the light emitting diode and creates first image data. The image photographic unit takes a photograph of the ultraviolet rays reflected from the light emitting diode and creates second image data. The determining unit determines the defect of an outer tube and light-emitting property of the light emitting diode using the first image data and the second image data. [Reference numerals] (10) Arrangement plate; (160) Image photographing unit; (170) Determining unit; (180) Display unit; (190) Storing unit