TESTING APPARATUS

• Main Author: NEGISHI TOSHIYUKI
• Format: Patent
• Language: English; Korean
• Published: 12.09.2012
• Subjects: INFORMATION STORAGE; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; STATIC STORES; TESTING

PURPOSE: A testing device is provided to generate pattern data which a degree of freedom is high in a high speed mode. CONSTITUTION: A testing device(100) includes a plurality of input/output units. A plurality of input/output units includes input/output units(10-1), and input/output units(10-2). The input/output units are connected to the other pin of a device under a test(200) or the other device under a test. The input/output units include a pattern generating unit(12-1,12-2), a pattern outputting unit(30-1,30-2), a driver(14-1,14-2), a comparator(16-1,16-2) and a determining unit(20-1,20-2). The pattern generating unit outputs an input pattern by synchronization in a preset test rate. The test rate has a preset period. The pattern generating unit has an algorithm pattern generating circuit generating the input pattern according to preset algorithm. The pattern outputting unit inputs the input pattern from the pattern generating unit by synchronization in the test rate. The driver outputs a test signal according to output data pattern of the pattern outputting unit. The comparator receives an output signal of the device under the test and detects a logical value of the output signal. The determining unit determines quality of the device under the test based on a comparison result of the comparing unit. [Reference numerals] (12-1,12-2) Pattern generating unit; (200) Device under a test; (20-1,20-2) Determining unit; (30-1,30-2) Pattern outputting unit