SYSTEM AND METHOD FOR DETECTING AND CORRECTING DEFECTIVE PIXELS IN AN IMAGE SENSOR
Various techniques are provided for the detection and correction of defective pixels in an image sensor. In accordance with one embodiment, a static defect table storing the locations of known static defects is provided, and the location of a current pixel is compared to the static defect table. If...
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Main Authors | , |
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Format | Patent |
Language | English Korean |
Published |
14.06.2012
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Subjects | |
Online Access | Get full text |
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Summary: | Various techniques are provided for the detection and correction of defective pixels in an image sensor. In accordance with one embodiment, a static defect table storing the locations of known static defects is provided, and the location of a current pixel is compared to the static defect table. If the location of the current pixel is found in the static defect table, the current pixel is identified as a static defect and is corrected using the value of the previous pixel of the same color. If the current pixel is not identified as a static defect, a dynamic defect detection process includes comparing pixel-to-pixel gradients between the current pixel a set of neighboring pixels against a dynamic defect threshold. If a dynamic defect is detected, a replacement value for correcting the dynamic defect may be determined by interpolating the value of two neighboring pixels on opposite sides of the current pixel in a direction exhibiting the smallest gradient. |
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Bibliography: | Application Number: KR20127012945 |