FOREIGN MATERIAL DETECTING DEVICE AND FOREIGN MATERIAL DETECTING METHOD

• Main Author: HOJO KATSUYUKI
• Format: Patent
• Language: English; Korean
• Published: 23.05.2012
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY; TESTING

A foreign material detecting device (10) detects a foreign material (Z) on a strip-like metal foil (20).  The foreign material detecting device (10) is provided with a transfer device (120) which transfers the metal foil (20) along a bent transfer path (12); an X-ray irradiator (14) which is arranged in one direction wherein the metal foil (20) is transferred, with respect to a part (W) where the metal foil (20) is transferred by being bent and irradiates X-rays (30) along the transfer path (12); and an X-ray detector (16) which is arranged in the other direction wherein the metal foil (20) is transferred, with respect to the part (W) where the metal foil (20) is transferred by being bent and detects the X-rays (30) irradiated from the X-ray irradiator (14).