FOREIGN MATERIAL DETECTING DEVICE AND FOREIGN MATERIAL DETECTING METHOD

A foreign material detecting device (10) detects a foreign material (Z) on a strip-like metal foil (20).  The foreign material detecting device (10) is provided with a transfer device (120) which transfers the metal foil (20) along a bent transfer path (12); an X-ray irradiator (14) which is arrange...

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Bibliographic Details
Main Author HOJO KATSUYUKI
Format Patent
LanguageEnglish
Korean
Published 23.05.2012
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY
TESTING
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Summary:A foreign material detecting device (10) detects a foreign material (Z) on a strip-like metal foil (20).  The foreign material detecting device (10) is provided with a transfer device (120) which transfers the metal foil (20) along a bent transfer path (12); an X-ray irradiator (14) which is arranged in one direction wherein the metal foil (20) is transferred, with respect to a part (W) where the metal foil (20) is transferred by being bent and irradiates X-rays (30) along the transfer path (12); and an X-ray detector (16) which is arranged in the other direction wherein the metal foil (20) is transferred, with respect to the part (W) where the metal foil (20) is transferred by being bent and detects the X-rays (30) irradiated from the X-ray irradiator (14).
Bibliography:Application Number: KR20127003625