Semiconductor Memory And Manufacturing Method Thereof
PURPOSE: A semiconductor memory and a manufacturing method thereof are provided to prevent an MTJ(Magnetic Tunnel Junction) from being damaged due to a wet attach by forming a magnetoresistive random access memory. CONSTITUTION: A first top electrode(130a) and a spacer(160) are used as an etch barri...
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Main Authors | , , , |
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Format | Patent |
Language | English Korean |
Published |
02.02.2012
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Subjects | |
Online Access | Get full text |
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Summary: | PURPOSE: A semiconductor memory and a manufacturing method thereof are provided to prevent an MTJ(Magnetic Tunnel Junction) from being damaged due to a wet attach by forming a magnetoresistive random access memory. CONSTITUTION: A first top electrode(130a) and a spacer(160) are used as an etch barrier. A bottom electrode(100a) is formed by etching a bottom electrode layer. The thickness of the first top electrode layer is 700 Å. The bottom electrode is connected to a unit memory cell or external circuit. |
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Bibliography: | Application Number: KR20100070527 |