Semiconductor Memory And Manufacturing Method Thereof

PURPOSE: A semiconductor memory and a manufacturing method thereof are provided to prevent an MTJ(Magnetic Tunnel Junction) from being damaged due to a wet attach by forming a magnetoresistive random access memory. CONSTITUTION: A first top electrode(130a) and a spacer(160) are used as an etch barri...

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Bibliographic Details
Main Authors LEE, MIN SUK, JUNG, BO KYOUNG, GYUN, BYUNG GU, SHIN, CHANG HYUP
Format Patent
LanguageEnglish
Korean
Published 02.02.2012
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Summary:PURPOSE: A semiconductor memory and a manufacturing method thereof are provided to prevent an MTJ(Magnetic Tunnel Junction) from being damaged due to a wet attach by forming a magnetoresistive random access memory. CONSTITUTION: A first top electrode(130a) and a spacer(160) are used as an etch barrier. A bottom electrode(100a) is formed by etching a bottom electrode layer. The thickness of the first top electrode layer is 700 Å. The bottom electrode is connected to a unit memory cell or external circuit.
Bibliography:Application Number: KR20100070527