SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME
PURPOSE: A semiconductor device and a forming method thereof are provided to improve yield and prevent the deterioration of a semiconductor device by burying an insulation layer in a punch area when a metal contact plug is formed. CONSTITUTION: A gate(102) is formed on an active area(100). A punch a...
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Main Author | |
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Format | Patent |
Language | English Korean |
Published |
10.01.2012
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Subjects | |
Online Access | Get full text |
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Summary: | PURPOSE: A semiconductor device and a forming method thereof are provided to improve yield and prevent the deterioration of a semiconductor device by burying an insulation layer in a punch area when a metal contact plug is formed. CONSTITUTION: A gate(102) is formed on an active area(100). A punch area exposes the gate. An insulation layer(116a) is buried in a punch area. A metal contact plug(122) is formed on the upper side of the insulation layer and is connected to a bit line(108). A first barrier layer(118a) is formed in the sidewall of a second barrier layer(120). |
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Bibliography: | Application Number: KR20100063994 |