SYSTEM FOR INSPECTING THIN FILM SOLAR CELL AND METHOD OF INSPECTING THIN FILM SOLAR CELL USING THE SAME

PURPOSE: A thin film solar cell check system and a method for inspecting a thin film solar cell using the same are provided to improve yield by estimating and analyzing the cause of a failure and utilizing repair technology. CONSTITUTION: A thin film solar cell(115) module is loaded in a table(130)....

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Bibliographic Details
Main Authors LEE, JEONG WOO, KIM, YOUNG JUN, KIM, DONG JU, KIM, HAE YEOL, LIM, KWANG YOUNG, KIM, JEONG YEOL
Format Patent
LanguageEnglish
Korean
Published 09.01.2012
Subjects
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRICITY
GENERATION
GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES
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Summary:PURPOSE: A thin film solar cell check system and a method for inspecting a thin film solar cell using the same are provided to improve yield by estimating and analyzing the cause of a failure and utilizing repair technology. CONSTITUTION: A thin film solar cell(115) module is loaded in a table(130). A light source(150) irradiates sunlight of 100mW/cm^2 to the surface of the thin film solar cell module. A shadow mask(170) regionally covers the thin film solar cell module by successively scanning the surface of the thin film solar cell module to perpendicularity and horizontal directions. A measuring instrument(160) measures an output according to the shadow mask and the scan of the shadow mask.
Bibliography:Application Number: KR20100063622