OPTICAL INSPECTION SYSTEM EMPLOYING SHORT WAVE INFRARED SENSING

• Main Author: SHYY YEU HWA
• Format: Patent
• Language: English; Korean
• Published: 24.11.2011
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A system for inspecting cigarette paper containing banded regions and non-banded regions. The system includes a short wave infrared camera, the short wave infrared camera forming electrical signals representing properties of the cigarette paper and a processor for analyzing the electrical signals to...