OPTICAL INSPECTION SYSTEM EMPLOYING SHORT WAVE INFRARED SENSING

• Main Author: SHYY YEU HWA
• Format: Patent
• Language: English; Korean
• Published: 24.11.2011
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A system for inspecting cigarette paper containing banded regions and non-banded regions. The system includes a short wave infrared camera, the short wave infrared camera forming electrical signals representing properties of the cigarette paper and a processor for analyzing the electrical signals to provide analysis results, the processor including logic for successively examining pixels to determine whether each successive pixel corresponds to a non-banded region or a banded region; logic for computing spacing between adjacent banded regions on the cigarette paper based on results provided by the logic for successively examining; and logic for computing width of banded regions on the cigarette paper based on results provided by the logic for successively examining. An online method for inspecting paper containing banded regions and non-banded regions is also provided.