METHOD OF FARBRICATING SEMICONDUCTOR DEVICE
A method of fabricating a semiconductor device includes forming a gate dielectric layer and a first gate layer sequentially on an overall surface of a substrate including a first region and a second region, forming a lanthanum-oxide (La2O3) mask pattern on the first gate layer disposed on the second...
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Main Authors | , , , , |
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Format | Patent |
Language | English Korean |
Published |
30.09.2011
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Subjects | |
Online Access | Get full text |
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Summary: | A method of fabricating a semiconductor device includes forming a gate dielectric layer and a first gate layer sequentially on an overall surface of a substrate including a first region and a second region, forming a lanthanum-oxide (La2O3) mask pattern on the first gate layer disposed on the second region, and selectively removing the first gate layer disposed on the first region by etching using the La2O3 mask pattern as a mask, thereby forming a first gate layer pattern on the second region. |
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Bibliography: | Application Number: KR20100026430 |