INTEGRATED CIRCUIT PROTECTED AGAINST HORIZONTAL SIDE CHANNEL ANALYSIS

The method involves dividing a set of physical parameters into subset of lateral points each corresponding to an elementary operation of an integrated circuit. A general hypothesis is formed for values corresponding to the subset of lateral points. A value of the physical parameters is estimated for...

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Bibliographic Details
Main Authors ROUSSELLET MYLENE, GAGNEROT GEORGES, FEIX BENOIT, VERNEUIL VINCENT
Format Patent
LanguageEnglish
Korean
Published 07.09.2011
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Summary:The method involves dividing a set of physical parameters into subset of lateral points each corresponding to an elementary operation of an integrated circuit. A general hypothesis is formed for values corresponding to the subset of lateral points. A value of the physical parameters is estimated for the subset of lateral points. A statistical processing step is performed for the subset of lateral points using the estimated value of the physical parameters if the general hypothesis is correct. An independent claim is also included for a system for testing an integrated circuit.
Bibliography:Application Number: KR20110018646