X-RAY INSPECTION SYSTEM AND METOHD USING THE SAME

PURPOSE: An X-ray checking system and checking method using the same are provided to secure checking quality by acquiring a slice image about a checked body. CONSTITUTION: A housing(10) shields radiation. An X-ray inspection unit(30) is installed in the inner side of the housing. An inline transport...

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Main Authors KIM, YOUNG MAN, KIM, HYUNG BUM, YOON, YEO SONG, KIM, SUN TAEK, YOON, JOONG SUK, PARK, BYUNG JUN, CHOI, KWANG NAM, OH, HYUN MYUNG, KIM, JONG HYUN
Format Patent
LanguageEnglish
Korean
Published 29.04.2011
Subjects
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PRINTED CIRCUITS
TESTING
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Summary:PURPOSE: An X-ray checking system and checking method using the same are provided to secure checking quality by acquiring a slice image about a checked body. CONSTITUTION: A housing(10) shields radiation. An X-ray inspection unit(30) is installed in the inner side of the housing. An inline transport unit(50) is installed in the inner side of the housing. The inline transport unit supplies a plurality of test materials. A controller(70) is electrically connected to the inline transport unit. The controller acquires the slice image through a GPU(Graphic Processing Unit) having parallel core. The controller distinguishes the first and the second brazing deformity. The controller obtains the slice image.
Bibliography:Application Number: KR20090101178