PREPARING METHOD OF DOUBLE LAYERED CONNECTION STRUCTURE OF PROBE UNIT FOR INSPECTION OF FLAT DISPLAY PANEL AND DOUBLE LAYERED CONNECTION STRUCTURE USING THE SAME

PURPOSE: A method for forming a multi layered connecting structure of a probe unit for inspecting a flat display panel and the multi layered connecting structure made by the same are provided to increase efficiency of a production process of a connecting structure. CONSTITUTION: A plurality of signa...

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Bibliographic Details
Main Authors KIM, JUNG TAE, SUH, SU JEONG, KIM, YOON SIK
Format Patent
LanguageEnglish
Korean
Published 03.03.2011
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE: A method for forming a multi layered connecting structure of a probe unit for inspecting a flat display panel and the multi layered connecting structure made by the same are provided to increase efficiency of a production process of a connecting structure. CONSTITUTION: A plurality of signal lines(31,32,33) is formed on a substrate. A short line short-circuits intervals among partial signal lines. An insulation photo resist layer(40) insulates a part except the short circuit part between a signal line and a short line.
Bibliography:Application Number: KR20090078352