METHOD OF DESIGNING A PRINTED CIRCUIT BOARD, AND PACKAGE TEST DEVICE HAVING THE PRINTED CIRCUIT BOARD

PURPOSE: A method and a package test device thereof are provided to accurately detect an internal defect by accurately measuring signals which are inputted from a test device. CONSTITUTION: A package capacitance, package inductance, and a chip capacitance of a memory device are calculated(S110). A s...

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Bibliographic Details
Main Authors JEONG, JAE HOON, KO, CHANG WOO, SONG, KI JAE, SEO, HUN KYO
Format Patent
LanguageEnglish
Korean
Published 11.01.2011
Subjects
Online AccessGet full text

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Summary:PURPOSE: A method and a package test device thereof are provided to accurately detect an internal defect by accurately measuring signals which are inputted from a test device. CONSTITUTION: A package capacitance, package inductance, and a chip capacitance of a memory device are calculated(S110). A signal line capacitance and a signal line inductance per unit length are calculated(S120). The length of the signal line is determined based on the package capacitance and the signal line capacitance(S130). A ground line inductance per length unit of the ground line is calculated based on the property of a PCB(S140). The length of the ground line according to a pin is determined based on the package inductance and the ground line inductance(S150). The sum total between stitch capacitance and pad capacitance is determined based on the chip capacitance(S160).
Bibliography:Application Number: KR20090060821