METHOD OF DESIGNING A PRINTED CIRCUIT BOARD, AND PACKAGE TEST DEVICE HAVING THE PRINTED CIRCUIT BOARD
PURPOSE: A method and a package test device thereof are provided to accurately detect an internal defect by accurately measuring signals which are inputted from a test device. CONSTITUTION: A package capacitance, package inductance, and a chip capacitance of a memory device are calculated(S110). A s...
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Main Authors | , , , |
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Format | Patent |
Language | English Korean |
Published |
11.01.2011
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Subjects | |
Online Access | Get full text |
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Summary: | PURPOSE: A method and a package test device thereof are provided to accurately detect an internal defect by accurately measuring signals which are inputted from a test device. CONSTITUTION: A package capacitance, package inductance, and a chip capacitance of a memory device are calculated(S110). A signal line capacitance and a signal line inductance per unit length are calculated(S120). The length of the signal line is determined based on the package capacitance and the signal line capacitance(S130). A ground line inductance per length unit of the ground line is calculated based on the property of a PCB(S140). The length of the ground line according to a pin is determined based on the package inductance and the ground line inductance(S150). The sum total between stitch capacitance and pad capacitance is determined based on the chip capacitance(S160). |
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Bibliography: | Application Number: KR20090060821 |