SUBSTRATE FOR ORGANIC ELECTROLUMINESCENT DEVICE AND METHOD OF INSPECTING THE SAME

PURPOSE: A substrate and an inspection method thereof are provided to improve productivity per hour by removing a following process step when a defect product is detected. CONSTITUTION: A gate and a data wire(119,130) define a plurality of pixel regions(R,G,B). A switching thin film transistor is co...

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Bibliographic Details
Main Authors PARK, JAE YONG, LEE, BYOUNG JUNE, PARK, JUNG HAN
Format Patent
LanguageEnglish
Korean
Published 06.01.2011
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC HEATING
ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:PURPOSE: A substrate and an inspection method thereof are provided to improve productivity per hour by removing a following process step when a defect product is detected. CONSTITUTION: A gate and a data wire(119,130) define a plurality of pixel regions(R,G,B). A switching thin film transistor is connected to the gate and the data wire. A driving thin-film transistor is connected to the switching thin film transistor. A gate connection wire(178) interlinks one end terminal of the entire gate wire. A MPS gate pad electrode(180) is formed in one end terminal of the gate connection wire.
Bibliography:Application Number: KR20090058416