APPARATUS FOR TESTING SEMICONDUCTOR DEVICE BY USING DISTRIBUTED CONTROL METHODS

PURPOSE: A semiconductor device test device is provided to minimize the facility costs by testing a plurality of semiconductor devices in parallel by using a low specification semiconductor device test device. CONSTITUTION: A master control part(200a) receives a relay control signal, wirelessly or w...

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Bibliographic Details
Main Authors JU, HYOUNG JUN, OH, CHANG SU
Format Patent
LanguageEnglish
Korean
Published 29.11.2010
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Summary:PURPOSE: A semiconductor device test device is provided to minimize the facility costs by testing a plurality of semiconductor devices in parallel by using a low specification semiconductor device test device. CONSTITUTION: A master control part(200a) receives a relay control signal, wirelessly or with a cable and transmits the signal to a PCB module. A slave control part is arranged within the PCB module. The slave control part receives the relay control signal from the master control part. A plurality of relay parts are arranged within the PCB module. The plurality of relay parts select a semiconductor device according to the relay control signal.
Bibliography:Application Number: KR20090043367