APPARATUS FOR TESTING SEMICONDUCTOR DEVICE BY USING DISTRIBUTED CONTROL METHODS

PURPOSE: A semiconductor device test device is provided to minimize the facility costs by testing a plurality of semiconductor devices in parallel by using a low specification semiconductor device test device. CONSTITUTION: A master control part(200a) receives a relay control signal, wirelessly or w...

Full description

Saved in:
Bibliographic Details
Main Authors JU, HYOUNG JUN, OH, CHANG SU
Format Patent
LanguageEnglish
Korean
Published 29.11.2010
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

More Information
Summary:PURPOSE: A semiconductor device test device is provided to minimize the facility costs by testing a plurality of semiconductor devices in parallel by using a low specification semiconductor device test device. CONSTITUTION: A master control part(200a) receives a relay control signal, wirelessly or with a cable and transmits the signal to a PCB module. A slave control part is arranged within the PCB module. The slave control part receives the relay control signal from the master control part. A plurality of relay parts are arranged within the PCB module. The plurality of relay parts select a semiconductor device according to the relay control signal.
Bibliography:Application Number: KR20090043367