WORK PROCESSING DEVICE OR INSPECTING METHOD OF ACF ATTACHMENT STATUS OR DISPLAY SUBSTRATE MODULE ASSEMBLING LINE

PURPOSE: A work process apparatus or ACF attaching state inspection method or a display substrate module assembly line are provided to shorten the total work time of the ACF attaching process and ACF attaching state inspection work. CONSTITUTION: An ACF attaching process apparatus(15) comprises four...

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Main Authors AKIBA YUJI, TAKEDA MASAOMI, KATAHO HIDEAKI, HISA TAKAFUMI, EBISAWA KEIICHI, TAMAMOTO JUNICHI, SAITO YOSHIHIRO, DOI HIDEAKI
Format Patent
LanguageEnglish
Korean
Published 06.10.2010
Subjects
BASIC ELECTRIC ELEMENTS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PRINTED CIRCUITS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE: A work process apparatus or ACF attaching state inspection method or a display substrate module assembly line are provided to shorten the total work time of the ACF attaching process and ACF attaching state inspection work. CONSTITUTION: An ACF attaching process apparatus(15) comprises four ACF attaching process units(15a~15d). An ACF attaching state inspection unit(20) is installed on a convey between a bottom unit apparatus and a TAB/IC mounting process apparatus(16). The ACF attaching state inspection unit is controlled by a lighting unit(21), a photographing unit(22), and an apparatus controller(30) to photograph the ACF attaching part.
Bibliography:Application Number: KR20100026611