THERMAL FLUX PROCESSING BY SCANNING ELECTROMAGNETIC RADIATION

A substrate is initially positioned in the reaction chamber. One or more gases are introduced into the reaction chamber. A predetermined speed for translating a line of radiation is determined. Continuous wave electromagnetic radiation is then emitted from a continuous wave radiation source. The con...

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Bibliographic Details
Main Authors MAYUR ABHILASH J, GOLDIN ALEXANDER, JENNINGS DEAN C, BEHRENS VERNON, TERTITSKI LEONID M, YAM MARK, O'BRIEN PAUL A
Format Patent
LanguageEnglish
Korean
Published 18.08.2010
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Summary:A substrate is initially positioned in the reaction chamber. One or more gases are introduced into the reaction chamber. A predetermined speed for translating a line of radiation is determined. Continuous wave electromagnetic radiation is then emitted from a continuous wave radiation source. The continuous wave electromagnetic radiation is subsequently focused into a line of radiation extending across the surface of the substrate. The line of radiation is then translated relative to the surface at the constant predetermined speed. The combination of the introduced gas/es and heat generated by the line of radiation causes the gas/es to react and deposit a layer on the surface of the substrate. Undesirable byproducts of the reaction are then flushed from the reaction chamber. This process is repeated until a layer having a predetermined thickness is formed on the surface of the substrate.
Bibliography:Application Number: KR20107014478